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 FPD1500SOT89
LOW NOISE HIGH LINEARITY PACKAGED PHEMT
FEATURES (1850MHZ):
* * * * * * 27.5 dBm Output Power (P1dB) 17 dB Small-Signal Gain (SSG) 1.2 dB Noise Figure 42 dBm Output IP3 50% Power-Added Efficiency FPD1500SOT89E - RoHS compliant
Datasheet v3.0
PACKAGE:
RoHS
GENERAL DESCRIPTION:
The FPD1500SOT89 is a packaged depletion mode AlGaAs/InGaAs pseudomorphic High Electron Mobility Transistor (pHEMT). It utilizes a 0.25 m x 1500 m Schottky barrier gate, defined by high-resolution stepper-based photolithography. The double recessed gate structure minimizes parasitics to optimize performance, with an epitaxial structure designed for improved linearity over a range of bias conditions and i/p power levels.
TYPICAL APPLICATIONS:
* * * Drivers or output stages in PCS/Cellular base station transmitter amplifiers High intercept-point LNAs WLL and WLAN systems, and other types of wireless infrastructure systems.
ELECTRICAL SPECIFICATIONS:
PARAMETER
Power at 1dB Gain Compression Small-Signal Gain Power-Added Efficiency
SYMBOL
P1dB SSG PAE
CONDITIONS
VDS = 5 V; IDS = 50% IDSS VDS = 5 V; IDS = 50% IDSS VDS = 5 V; IDS = 50% IDSS; POUT = P1dB
MIN
26.0 15.5
TYP
27.5 17 50
MAX
UNITS
dBm dB %
Noise Figure
NF
VDS = 5 V; IDS = 50% IDSS VDS = 5 V; IDS = 25% IDSS
1.0
1.2
dB
Output Third-Order Intercept Point (from 15 to 5 dB below P1dB)
IP3
VDS = 5V; IDS = 50% IDSS Matched for optimal power Matched for best IP3 38 40 42 375 465 750 400 1 0.7 12 12 1.0 16 16 60 15 1.3 550 mA mA mS A V V V C/W dBm
Saturated Drain-Source Current Maximum Drain-Source Current Transconductance Gate-Source Leakage Current Pinch-Off Voltage Gate-Source Breakdown Voltage Gate-Drain Breakdown Voltage Thermal Resistance
IDSS IMAX GM IGSO |VP| |VBDGS| |VBDGD| RJC
VDS = 1.3 V; VGS = 0 V VDS = 1.3 V; VGS +1 V VDS = 1.3 V; VGS = 0 V VGS = -5 V VDS = 1.3 V; IDS = 1.5 mA IGS = 1.5 mA IGD = 1.5 mA
Note: TAMBIENT = 22; RF specification measured at f = 1850 MHz using CW signal (except as noted) 1
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FPD1500SOT89
Datasheet v3.0
ABSOLUTE MAXIMUM RATING :
PARAMETER
Drain-Source Voltage Gate-Source Voltage Drain-Source Current Gate Current RF Input Power 2
1
SYMBOL
VDS VGS IDS IG PIN TCH TSTG PTOT Comp. 3
TEST CONDITIONS
-3V < VGS < +0V 0V < VDS < +8V For VDS < 2V Forward or reverse current Under any acceptable bias state Under any acceptable bias state Non-Operating Storage See De-Rating Note below Under any bias conditions 2 or more Max. Limits
ABSOLUTE MAXIMUM
8V -3V IDSS 15mA 350mW 175C -55C to 150C 2.3W 5dB
Channel Operating Temperature Storage Temperature Total Power Dissipation Gain Compression Simultaneous Combination of Limits
Notes: 1 TAmbient = 22C unless otherwise noted; exceeding any one of these absolute maximum ratings may cause permanent damage to the device 2 Max. RF Input Limit must be further limited if input VSWR > 2.5:1 3 Users should avoid exceeding 80% of 2 or more Limits simultaneously 4 Total Power Dissipation defined as: PTOT (PDC + PIN) - POUT, where PDC: DC Bias Power, PIN: RF Input Power, POUT: RF Output Power Total Power Dissipation to be de-rated as follows above 22C: PTOT= 2.3 - (0.016W/C) x TPACK where TPACK= source tab lead temperature above 22C (coefficient of de-rating formula is the Thermal Conductivity) Example: For a 65C carrier temperature: PTOT = 2.3W - (0.016 x (65 - 22)) = 1.61W
BIASING GUIDELINES:
* * * Active bias circuits provide good performance stabilization over variations of operating temperature, but require a larger number of components compared to self-bias or dual-biased. Such circuits should include provisions to ensure that Gate bias is applied before Drain bias. Dual-bias circuits are relatively simple to implement, but will require a regulated negative voltage supply for depletion-mode devices. For standard class A operation, a 50% of IDSS bias point is recommended. A small amount of RF gain expansion prior to the onset of compression is normal for this operating point. A class A/B Bias of 25-33% of IDSS to achieve better OIP3, and Noise Figure performance is suggested.
2
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FPD1500SOT89
Datasheet v3.0
FREQUENCY RESPONSE:
Biased @ 5V 50%IDSS
1.4
MSG S21
Biased @ 5V, 200mA
1.2 Noise FIgure (dB) 1 0.8 0.6 0.4 0.2 0 0.5 0.9 1.3 1.7 2.1 2.5 2.9 3.3 3.7 4.1 4.5 4.9 5.3 5.7
N.F. (dB)
35 30
MSG Mag S21 &
25 20 15 10 5 0 0.5 1.5 2.5 3.5 4.5 5.5 Frequency (GHz) 6.5 7.5 8
Frequency (GHz)
Note: Device tuned for minimum noise figure
TEMPERATURE RESPONSE:
Biased @ 5V, 50% IDSS Data taken on Eval Board at 1.85GHz
Biased @ 5V, 33%IDSS Data taken on Eval board @ 1.85GHz
18.0 17.0
SSG (dB)
15.0 14.0 13.0 12.0
SSG (dB) P1dB (dBm)
P1dB (dBm)
16.0
10
20
30
40
50
60
70
80
-20
-20
-10
-10
10
20
30
40
50
60
70
80
90
Temperature (C)
Temperature (C)
Note: Evaluation board tuned for maximum power
3
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90
0
0
30.0 29.0 28.0 27.0 26.0 25.0 24.0 23.0 22.0 21.0 20.0
.70 .60 .50 .40 .30 .20 .10 .00
Noise Figure (dB)
N.F.
(dB)
FPD1500SOT89
Datasheet v3.0
TYPICAL TUNED RF PERFORMANCE:
Power Transfer Characteristic
3.50 29.00
Pout Comp Point
Drain Efficiency and PAE
70.00%
3.00
70.00%
27.00 2.50 25.00
Gain Compression (dB)
60.00%
PAE Eff.
60.00%
50.00% PAE (%)
50.00%
Drain Efficiency (%)
Output Power (dBm)
2.00 23.00 21.00 19.00 17.00 15.00 13.00 -2.00 1.50
40.00%
40.00%
1.00
30.00%
30.00%
.50
20.00%
20.00%
.00
10.00%
10.00%
0.00
2.00
4.00
6.00
8.00
10.00
12.00
14.00
-.50 16.00
.00% -2.00
0.00
2.00
4.00
6.00
8.00
10.00
12.00
14.00
.00% 16.00
Input Power (dBm)
Input Power (dBm)
NOTE: Typical power and efficiency is shown above. The devices were biased nominally at VDS = 5V, IDS = 50% of IDSS, at a test frequency of 1.85 GHz. The test devices were tuned (input and output tuning) for maximum output power at 1dB gain compression.
Typical Intermodulation Performance VDS = 5V IDS = 50% IDSS at f = 1.85GHz
-10.00 25.00
-15.00
-20.00 23.00
-25.00
21.00
-30.00
-35.00 19.00 -40.00
-45.00 17.00 -50.00
15.00 -1.00 1.00 3.00 5.00
Input Power (dBm)
-55.00 7.00 9.00 Pout 11.00 Im3, dBc
Note: pHEMT devices have enhanced intermodulation performance. This yields OIP3 values of about P1dB + 14dBm. This IMD enhancement is affected by the quiescent bias and the matching applied to the device.
TYPICAL I-V CHARACTERISTICS
DC IV Curves FPD1500SOT89 0.60
0.50
0.40
0.30
0.20
VG=-1.5V VG-1.25V VG=-1.00V VG=-0.75V VG=-0.5V VG=-0.25V VG=0V
0.10
Note: The recommended method for measuring IDSS, or any particular IDS, is to set the Drain-Source voltage (VDS) at 1.3V. This measurement point avoids the onset of spurious self-oscillation which would normally distort the current measurement (this effect has been filtered from the I-V curves presented above). Setting the VDS > 1.3V will generally cause errors in the current measurements, even in stabilized circuits.
Drain-Source Current (A)
0.00 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
Drain-Source Voltage (V)
4
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3rd Oder IM Poroducts (dBc)
Output Power (dBm)
Website: www.filtronic.com
FPD1500SOT89
Datasheet v3.0
TYPICAL OUTPUT PLANE POWER CONTOURS (VDS = 5v, IDS = 50%IDSS) :
Swp Max 159
2. 0
0.4 1. 0 2. 0 3.0
0. 6 0.4
0. 8
1. 0
0. 6
0. 8
Swp Max 123
3.0
22dBm
0.2
4.0 5.0
0.2
23dBm 24dBm
0 0. 2 0. 26dBm 4 0. 6 0. 1. 0 8 2. 0 3. 4. 5. 0 00
10.0 10 .0
0 0. 2
23dBm 24dBm 25dBm 26dBm
0. 27dBm 4 0. 6 0. 1. 0 8 2. 0 3. 4. 5. 0 00
4.0 5.0
10.0 10 .0
25dBm
28dBm
27dBm
-0.2
-10.0
-0.2
-10.0
28dBm
-5.0 -4.0 -3.0 -0.4 0. 6 2. 0 1. 0
-5.0 -4.0 -0.4 0. 6
22dBm
2. 0 1. 0
-3.0
0. 8
Swp Min 1
0. 8
Swp Min 1
1850 MHz Contours swept with a constant input power, set so that optimum P1dB is achieved at the point of output match. Input (Source plane) s: 0.74 168.2 0.15 + j0.1 (normalized) 7.5 + j5.0 Nominal IP3 performance is obtained with this input plane match, and the output plane match as shown.
900 MHz Contours swept with a constant input power, set so that optimum P1dB is achieved at the point of output match. Input (Source plane) s: 0.67 103.6 0.30 + j0.74 (normalized) 15 + j37.0 Nominal IP3 performance is obtained with this input plane match, and the output plane match as shown.
TYPICAL SCATTERING PARAMETERS (50 SYSTEM):
FPD1500SOT89 5V / 50%IDSS
6 0.
2. 0
FPD1500SOT89 5V / 50%IDSS
Swp Max 8GHz
0. 8 0. 6 0.4 3.0
0 4.
5 .0
0.8
1. 0 2. 0
5 GHz
6 GHz
Swp Max 8GHz
1.0
4 GHz
7 GHz
0 3.
3.5 GHz 3 GHz
0.2
2.5 GHz
10.0 0.4 2.0 4.0 0.2 0.8 1.0 3.0 5.0 0.6
0
2 GHz
1.5 2GHz
- 5.
.4 -0
1 GHz
.0 -2
-0.8
-1.0
S11
-0 .6
Swp Min 0.5GHz
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-4 .0
0
-0.
-10.0
-3 .0
0. 4
0.2
5 GHz 4 GHz 3 GHz
6 GHz
4.0
7 GHz
5.0
10.0
10.0 0. 8 1. 0 2. 0 3. 4. 5. 0 00 10 .0
0
0. 2
0. 0. 2 GHz 6 4
1 GHz
-10.0 -0.2 -5.0 -4.0 -0.4 0. 6 2. 0 1. 0 -3.0
S22
0. 8
Swp Min 0.5GHz
5
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FPD1500SOT89
STATISTICAL SAMPLE OF RF PERFORMANCE:
Datasheet v3.0
Small Signal Gain
6000
Noise Figure
14000 12000 10000 8000 6000 4000 2000 0 13 14 15 16 17 Gain (dB) 18
5000 4000 Count 3000 2000 1000 0 0.6 0.7 0.8 0.9 1 1.1 1.2 NF (dB) 1.3
Count
Output Power at 1dB Gain Compression
14000 12000 10000 Count 8000 6000 4000 2000 0 23 24 25 26 27 P1dB (dBm) 28
Count 6000 5000 4000 3000 2000 1000 0 30
Output 3 -Order Intercept Point
rd
32
34
36
38
40
42
44
IP3 (dBm)
Note: The devices were tested by a high-speed automatic test system, in a matched circuit based on 2GHz Evaluation Board. This circuit is a dual-bias single-pole lowpass topology, and the devices were biased at VDS = 4.5V, IDS = 120mA, Test Frequency = 2.0GHz. The performance data is summarized below:
Parameter Small-Signal Gain Noise Figure Output Power (P1dB) rd 3 -Order Intercept
Median 15.5 0.91 25.2 38.7
Standard Deviation 0.20 0.03 0.25 1.1
Test Limit 14.5 1.20 24.5 36.5
CPK 1.7 3.2 0.93 0.67
6
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FPD1500SOT89
REFERENCE DESIGN 0.9GHZ
FREQUENCY Gain P1dB OIP31 N.F. S11 S22 Vd Vg Id GHZ dB dBm dBm dB dB dB V V mA 0.9 20 27 39 0.7 -5 -15 5 -0.4 to -0.6 200
Datasheet v3.0
1. Measured at 15dBm per tone
Board Layout
Vg 33pF 0.01uF 20O Lg 33pF L1 33pF 0.01uF Vd
+ 1.0uF +
Q1
Ld C1 33pF
0.63"
L2
1.45"
Component Values
Component Lg Ld L1 L2 Value 47nH 47nH 12nH 4.7nH Description LL1608 Toko chip inductor LL1608 Toko chip inductor LL1005 Toko chip inductor LL1005 Toko chip inductor
RF IN
Schematic
-Vg
Vd
0.01uF 33pF 20 Ohm 47 nH L1 47 nH C1
1.0uF 0.01uF 33pF 33pF
RF OUT
33pF
C1 5.6pF ATC 600S chip capacitor Eval board material - 31mil thick FR4 with 1/2 Ounce Cu on both sides
L2
D.C. Blocking capacitors are ATC series 600S. A tantalum 1.0F is used at the drain terminal. All other capacitors are 0603 and 0805 standard chip capacitors. A 0603 size 20 Ohm Chip resistor from Vishay is used on the gate D.C. bias line for stability.
7
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FPD1500SOT89
REFERENCE DESIGN 1.85GHZ
FREQUENCY Gain P1dB OIP31 N.F. S11 S22 Vd Vg Id GHZ dB dBm dBm dB dB dB V V mA 1.85 16 27 41 0.9 -9 -14 5 -0.4 to -0.6 200
Datasheet v3.0
1. Measured 15dBm per tone
Board Layout
Vg 33pF 0.01uF 20O Lg 33pF L1 33pF 0.01uF Vd
+ 1.0uF +
Q1
Ld C1 33pF
0.63"
L2
1.45"
Component Values
Component Lg Ld L1 L2 C1 Value 27nH 27nH 1.5nH 4.7nH 2.2pF Description LL1608 Toko chip inductor LL1608 Toko chip inductor LL1005 Toko chip inductor LL1005 Toko chip inductor ATC 600S chip capacitor
Schematic
0.01uF 33pF
-Vg
Vd
1.0uF 0.01uF 20 Ohm 27 nH 27 nH C1 33pF 33pF
RF OUT
33pF
RF IN
L1
Eval board material - 31mil thick FR4 with 1/2 Ounce Cu on both sides
L2
D.C. Blocking capacitors are ATC series 600S. A tantalum 1.0F is used at the drain terminal. All other capacitors are 0603 and 0805 standard chip capacitors. A 0603 size 20 Ohm Chip resistor from Vishay is used on the gate D.C. bias line for stability.
8
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FPD1500SOT89
REFERENCE DESIGN 2.4 TO 2.6GHZ
FREQUENCY Gain P1dB OIP31 N.F. S11 S22 Vd Vg Id GHZ 2.4 2.6
Datasheet v3.0
dB 12.5 12.4 dBm 28 28 dBm 39 40 dB 1.0 0.9 dB -14 -16 dB -5 -6 V 5 5 V -0.4 to -0.6 -0.4 to -0.6 mA 200 200
1. Measured at 15dBm per tone
Board Layout
Vg 33pF 0.01uF 20O Lg 33pF C1
L1
Vd 33pF 0.01uF Ld C2 33pF
+ 1.0uF +
Q1
0.63"
L2
1.45"
Component Values
Component Lg Ld L1 L2 C1 & C2 Value 18nH 18nH 0.0nH 3.9nH 1.0pF Description LL1608 Toko chip inductor LL1608 Toko chip inductor No Component (Cu Tab) LL1005 Toko chip inductor ATC 600S chip capacitor
Schematic
-Vg
Vd
0.01uF 33pF 20 Ohm 18 nH
1.0uF 0.01uF 33pF 18 nH C2 33pF
RF OUT
33pF
RF IN
Eval board material - 31mil thick FR4 with 1/2 Ounce Cu on both sides
C1
L2
D.C. Blocking capacitors are ATC series 600S. A tantalum 1.0F is used at the drain terminal. All other capacitors are 0603 and 0805 standard chip capacitors. A 0603 size 20 Ohm Chip resistor from Vishay is used on the gate D.C. bias line for stability.
9
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FPD1500SOT89
Datasheet v3.0
S-PARAMETERS: BIASED @ 5V, 50%IDSS:
FREQ[GHz] 0.500 0.750 1.000 1.250 1.500 1.750 2.000 2.250 2.500 2.750 3.000 3.250 3.500 3.750 4.000 4.250 4.500 4.750 5.000 5.250 5.500 5.750 6.000 6.250 6.500 6.750 7.000 7.250 7.500 7.750 8.000 8.250 8.500 8.750 9.000 9.250 9.500 9.750 10.000 10.250 10.500 10.750 11.000 11.250 11.500 11.750 12.000 S11m 0.865 0.763 0.728 0.714 0.701 0.694 0.692 0.684 0.685 0.683 0.681 0.692 0.690 0.698 0.706 0.711 0.730 0.742 0.757 0.765 0.769 0.790 0.847 0.830 0.850 0.826 0.829 0.828 0.823 0.836 0.855 0.858 0.855 0.863 0.874 0.875 0.885 0.890 0.895 0.897 0.899 0.902 0.902 0.907 0.913 0.912 0.908 S11a -91.9 -118.7 -136.4 -149.6 -162.1 -171.3 179.8 171.3 163.7 155.8 148.1 141.4 134.1 127.7 120.8 114.3 108.9 103.2 98.2 92.4 87.7 83.4 77.1 73.0 67.3 63.8 60.2 56.4 52.8 48.9 44.5 38.3 32.9 27.9 22.0 16.9 11.9 7.4 3.8 0.5 -2.9 -5.6 -8.1 -10.5 -13.5 -16.4 -19.4 S21m 18.828 14.373 11.562 9.707 8.254 7.225 6.460 5.820 5.320 4.884 4.506 4.199 3.913 3.651 3.418 3.207 3.018 2.834 2.672 2.531 2.408 2.300 2.263 2.139 2.046 1.926 1.839 1.763 1.698 1.641 1.580 1.512 1.442 1.374 1.311 1.247 1.182 1.124 1.069 1.012 0.975 0.928 0.894 0.865 0.845 0.822 0.806 S21a 121.6 107.4 95.9 87.0 79.1 71.2 64.2 57.4 50.7 44.6 37.8 31.4 25.1 18.8 12.7 6.5 0.8 -5.0 -10.6 -16.1 -21.7 -26.9 -33.3 -38.4 -45.2 -49.9 -54.7 -59.5 -64.6 -69.8 -75.7 -81.5 -86.8 -92.3 -97.5 -102.5 -107.8 -112.5 -117.4 -121.7 -126.0 -130.2 -134.3 -138.4 -142.1 -146.4 -150.7 S12m 0.027 0.033 0.038 0.043 0.047 0.052 0.057 0.061 0.067 0.071 0.076 0.080 0.085 0.089 0.093 0.096 0.100 0.102 0.105 0.108 0.111 0.114 0.121 0.122 0.124 0.125 0.127 0.128 0.130 0.133 0.135 0.135 0.136 0.136 0.136 0.135 0.134 0.133 0.131 0.128 0.125 0.120 0.117 0.115 0.114 0.114 0.117 S12a 52.3 46.3 42.6 39.6 37.4 34.6 32.1 29.4 26.1 23.5 19.7 16.0 12.4 8.5 4.6 0.5 -3.5 -7.4 -11.1 -14.6 -18.6 -22.2 -27.1 -30.6 -36.0 -39.1 -42.7 -46.1 -49.9 -54.2 -58.9 -63.5 -68.0 -72.8 -77.2 -81.6 -86.4 -91.4 -96.4 -101.8 -106.8 -111.1 -114.6 -118.0 -120.9 -124.3 -128.3 S22m 0.293 0.287 0.293 0.285 0.284 0.288 0.279 0.279 0.271 0.273 0.273 0.276 0.290 0.302 0.318 0.335 0.349 0.367 0.381 0.396 0.406 0.417 0.457 0.457 0.476 0.471 0.471 0.470 0.477 0.491 0.507 0.531 0.552 0.575 0.596 0.618 0.637 0.652 0.663 0.673 0.680 0.693 0.698 0.701 0.695 0.691 0.684 S22a -130.2 -141.8 -154.9 -162.6 -172.6 -178.7 175.2 168.4 161.9 153.9 147.1 138.5 131.2 124.2 118.0 112.5 107.0 101.4 96.3 91.7 87.3 83.2 79.0 75.1 68.2 62.2 55.5 50.2 44.5 39.2 33.8 29.3 24.7 21.2 17.7 15.4 13.0 11.0 8.0 5.1 2.5 0.0 -2.9 -6.0 -9.7 -13.3 -18.1
10
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FPD1500SOT89
PACKAGE OUTLINE:
(dimensions in millimeters - mm)
Datasheet v3.0
TAPE DIMENSIONS AND PART ORIENTATION:
FWYN
Also available with horizontal part orientation Hub diameter = 80mm Devices per reel = 1000
11
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FPD1500SOT89
Datasheet v3.0
DEVICE FOOT PRINT:
APPLICATION NOTES & DESIGN DATA:
Application Notes and design data including Sparameters, noise parameters and device model are available on request.
RELIABILITY:
A MTTF of 7.4 million hours at a channel temperature of 150C is achieved for the process used to manufacture this device.
DISCLAIMERS:
This product is not designed for use in any space based or life sustaining/supporting equipment.
Units in inches
NOTE: Drawing available on Website
ORDERING INFORMATION:
PREFERRED ASSEMBLY INSTRUCTIONS:
This package is compatible with both lead free and leaded solder reflow processes as defined within IPC/JEDEC J-STD-020C. The maximum package temperature should not exceed 260C. PART NUMBER
FPD1500SOT89 FPD1500SOT89E
DESCRIPTION
Packaged pHEMT RoHS Compliant Packaged pHEMT RoHS Compliant Packaged pHEMT with enhanced passivation (Recommended for New Designs)
HANDLING PRECAUTIONS:
To avoid damage to the devices care should be exercised during handling. Proper Electrostatic Discharge (ESD) precautions should be observed at all stages of storage, handling, assembly, and testing.
FPD1500SOT89CE
EB1500SOT89(E)-BB EB1500SOT89(E)-BA EB1500SOT89(E)-BC EB1500SOT89(E)-BD EB1500SOT89(E)-BE EB1500SOT89(E)-BG
0.9 GHz evaluation board 1.85 GHz evaluation board 2.0 GHz evaluation board 2.2 GHz evaluation board 2.4 GHz evaluation board 2.6 GHz evaluation board 5.3-5.75 GHz evaluation board
ESD/MSL RATING:
These devices should be treated as Class 0 (0250 V) using the human body model as defined in JEDEC Standard No. 22-A114. The device has a MSL rating of Level 2. To determine this rating, preconditioning was performed to the device per, the Pb-free solder profile defined within IPC/JEDEC J-STD-020C, Moisture / Reflow sensitivity classification for non-hermatic solid state surface mount devices.
12
EB1500SOT89(E)-AJ
Tel: +44 (0) 1325 301111
Specifications subject to change without notice Filtronic Compound Semiconductors Ltd Fax: +44 (0) 1325 306177 Email: sales@filcs.com
Website: www.filtronic.com


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